Electronic Packaging Laboratory

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Projects:


  • Computational Analysis
    • Molecular Dynamic Simulations of diffusion in solder joints
    • Molecular Dynamic Simulations of Carbon NanoTubes as VLSI interconnects
    • Material nonlinear analysis of Surface Mount Packaging (thermal and dynamic)
    • Damage mechanics of Pb/Sn solder alloys based on Thermodynamics and Statistical Mechanics
    • Dislocation mechanics based strain gradient method for damage mechanics of electronic packaging interconnects
    • Damage mechanics of solder interconnects under high electrical current density
    • Damage mechanics of layered semiconductor devices under thermal shock
    • Damage mechanics of infilled polymer composites
    • Evaluation of Alternate I/O Routing for Bumpless BGA-Printed Circuit Boards

 

  • Experimental Studies
    • Automatic Full Strain Field Moiré Interferometery Measurement with Nano-scale Resolution
    • Thermomigration of nanoelectronics solder joints
    • Electromigration in flip chip solder joints
    • Low temperature interaction of electromigration and thermomigration
    • Fatigue life prediction by Highly Accelerated Thermal Cycling
    • Reliability of packages under severe vibration testing
    • Reliability of Power Electronics Building Blocks subjected to concurrent thermal cycling and vibrations
    • Experimental damage mechanics of BGA solder joints under high electrical current densities
    • Using pulse laser to determine material degradation at sub micron scale






 

102 Ketter Hall • Buffalo, New York 14260 • Phone: 716-645-2114 ext. 2429 • Fax: 716-645-3733