Electronic Packaging Laboratory
[ Home | People | Services | Equipment | Publications | Projects | In the News | Clients & Sponsors ]

Services:

  • Computational Reliability Analysis and Design
    • Reliability and structural analysis for packages, interconnects, vias, interfaces, devices and substrates
    • Material/Interface modeling
    • Custom software development for life cycle analysis
    • Damage and fracture mechanics
    • Nonlinear Finite Element Analysis
      • Thermo-elasto-viscoplastic fatigue analysis
      • Mode shape/ Modal frequency analysis


  • Experimental Reliability Analysis and Design
    • Thermal cycling, and vibration testing under extreme conditions
    • Electro-migration and thermo-migration testing under high current density
    • Lead-Free Solder Material Selection
    • Material and Interface Characterization
    • Failure Mode Characterization
    • Screening and HAST
    • Nano-indentation studies for material property determination post manufacturing
    • Solder Joint, IMC microstructure and metallurgy inspection
    • Solder joint-UBM interface inspection
    • Solder joint and printed circuit board quality and integrity studies
    • Photo-damage-mechanics
      • Moiré Interferometry
      • Twyman-Green and Speckle Interferometry
102 Ketter Hall • Buffalo, New York 14260 • Phone: 716-645-2114 ext. 2429 • Fax: 716-645-3733